发明名称 Automatic classification of defects
摘要 A method of automatically classifying defects. The method generally includes the steps of (A) receiving information for a current defect, (B) extracting field values from the current defect, (C) counting a number of occurrences of one or more keywords in the current defect, (D) determining one or more new keywords occurring in the current defect and storing the one or more new keywords in a database and (E) creating one or more linkages in the database between a first record corresponding to the current defect and one or more second records corresponding to previous defects based upon one or more similarities between the first and the second records.
申请公布号 US8140514(B2) 申请公布日期 2012.03.20
申请号 US20080323625 申请日期 2008.11.26
申请人 NGUYEN KHANH;ANDERSON SEONMI;PETERSON MICHAEL L.;LSI CORPORATION 发明人 NGUYEN KHANH;ANDERSON SEONMI;PETERSON MICHAEL L.
分类号 G06F17/30 主分类号 G06F17/30
代理机构 代理人
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