A test assembly that may provide access to signals of a circuit that includes an integrated circuit. The test assembly may include structural members that limit movement of components relative to each other.
申请公布号
US8138776(B2)
申请公布日期
2012.03.20
申请号
US20090495552
申请日期
2009.06.30
申请人
SHELSKY ROBERT C.;GRAHAM KENNETH W.;EVERSON DENNIS D.
发明人
SHELSKY ROBERT C.;GRAHAM KENNETH W.;EVERSON DENNIS D.