发明名称 Integrated circuits with asymmetric pass transistors
摘要 Asymmetric transistors such as asymmetric pass transistors may be formed on an integrated circuit. The asymmetric transistors may have gate structures. Symmetric pocket implants may be formed in source-drains on opposing sides of each transistor gate structure. Selective heating may be used to asymmetrically diffuse the implants. Selective heating may be implemented by patterning the gate structures on a semiconductor substrate so that the spacing between adjacent gate structures varies. A given gate structure may be located between first and second adjacent gate structures spaced at different respective distances from the given gate structure. A larger gate structure spacing leads to a greater substrate temperature rise than a smaller gate structure spacing. The pocket implant diffuses more in portions of the substrate with the greater temperature rise, producing asymmetric transistors. Asymmetric pass transistors may be controlled by static control signals from memory elements to implement circuits such as programmable multiplexers.
申请公布号 US8138797(B1) 申请公布日期 2012.03.20
申请号 US20100790660 申请日期 2010.05.28
申请人 LIU JUN;RATNAKUMAR ALBERT;CHAN MARK T.;RAHIM IRFAN;ALTERA CORPORATION 发明人 LIU JUN;RATNAKUMAR ALBERT;CHAN MARK T.;RAHIM IRFAN
分类号 H01L25/00;H03K19/00 主分类号 H01L25/00
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