发明名称 OXIDE SINTERED COMPACT AND OXIDE SEMICONDUCTOR THIN FILM
摘要 <P>PROBLEM TO BE SOLVED: To provide an oxide sintered compact not containing expensive gallium (Ga) and having a small bulk resistance, and to provide an oxide semiconductor thin film having the same composition as that of the oxide sintered compact. <P>SOLUTION: The oxide sintered compact consists of indium (In), zinc (Zn), a metal element X (where, X represents one kind or more of metal selected from Al and Ti), and oxygen (O) where the atomic ratios of indium (In), zinc (Zn), and metal element X satisfy following relations; 0.2&le;In/(In+Zn+X)&le;0.8, 0.1&le;Zn/(In+Zn+X)&le;0.5, and 0.1&le;X/(In+Zn+X)&le;0.5. An oxide semiconductor thin film having the same composition as the atomic ratios and deposited by sputtering using the oxide sintered compact as a target is also provided. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2012054335(A) 申请公布日期 2012.03.15
申请号 JP20100194455 申请日期 2010.08.31
申请人 JX NIPPON MINING & METALS CORP 发明人 TAKAMI HIDEO;OSADA KOZO
分类号 H01L21/203;H01L29/786 主分类号 H01L21/203
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