发明名称 |
ON-DIE DIGITAL-TO-ANALOG CONVERSION TESTING |
摘要 |
In one embodiment, an analog-to-digital conversion in an integrated circuit is evaluated by an on-die testing circuit. For example, the on-die test circuit 370 can characterize one or both of the linearity and monotonicity of the digital-to-analog conversion. The value of a conversion output for a digital input code may be compared to the value of a prior conversion output of a prior step to provide digital difference values for each step of a sweep of digital input codes. Digital difference values may be compared to one or more predetermined limits to provide one or more pass/fail tests on-board the die. Other embodiments are described and claimed.
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申请公布号 |
US2012062401(A1) |
申请公布日期 |
2012.03.15 |
申请号 |
US20100883125 |
申请日期 |
2010.09.15 |
申请人 |
ZEPEDA PAOLA;DUARTE DAVID E.;TAYLOR GREGORY F.;MAHESHWARI ATUL |
发明人 |
ZEPEDA PAOLA;DUARTE DAVID E.;TAYLOR GREGORY F.;MAHESHWARI ATUL |
分类号 |
H03M1/10 |
主分类号 |
H03M1/10 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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