| 摘要 |
PURPOSE: A carrier module of a test handler is provided to accurately grip and release a semiconductor device without damaging a lead and a ball which are formed in the lower part of a semiconductor device. CONSTITUTION: A carrier body(210) forms a space part for storing a semiconductor device. A plurality of buttons(220) are installed in the storing part of the carrier body. A plurality of guide pins(230) are inserted into the button. A plurality of latchs(240) forms a first guide hole towards a first direction. A second guide hole is formed. The guide hole is communicated with the first guide hole in a second direction. An elastic member(250) is connected to the storing part and a plurality of buttons and applies elastic force to a button. |
