发明名称 One transistor DRAM cell structure and method for forming
摘要 A single transistor DRAM cell is formed in a SOI substrate so that the DRAM cells are formed in bodies that are electrically isolated from each other. Each cell has doped regions that act as source and drain contacts. Between the drain contact and the body is a region, which aids in impact ionization and thus electron/hole formation during programming that is the same conductivity type as the body but of a higher concentration than the body. Adjacent to the source contact and to the body is a region, which aids in diode current during erase, that is the same conductivity type as the source contact but of a lower concentration than the source contact.
申请公布号 US2004089890(A1) 申请公布日期 2004.05.13
申请号 US20020290904 申请日期 2002.11.08
申请人 BURNETT JAMES D. 发明人 BURNETT JAMES D.
分类号 H01L21/265;H01L21/336;H01L21/8242;H01L21/84;H01L27/108;H01L27/12;H01L29/10;H01L29/786;(IPC1-7):H01L27/108 主分类号 H01L21/265
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