发明名称 SEMICONDUCTOR DEVICE MANUFACTURING METHOD
摘要 <P>PROBLEM TO BE SOLVED: To provide a semiconductor device manufacturing method that inhibits generation of voids when mounting a semiconductor chip on a wiring board with a paste adhesive interposed therebetween. <P>SOLUTION: The semiconductor device manufacturing method comprises a die-bonding step of mounting a semiconductor chip on a chip mount region 20a included in a wiring board 40 with an adhesive interposed therebetween. The wiring board 40 includes a plurality of distribution lines (first distribution lines) 23a formed on a top face of a core layer and dummy distribution lines (second distribution lines) 23d. The chip mount region 20a is disposed on a plurality of distribution lines 23a and dummy distribution line 23d. The die-bonding step includes a step of disposing the adhesive on an adhesive arrangement region on the chip mount region 20a. Each of the plurality of dummy distribution lines 23d extends along a direction in which the adhesive spreads in the die-bonding step. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2012054264(A) 申请公布日期 2012.03.15
申请号 JP20100193161 申请日期 2010.08.31
申请人 RENESAS ELECTRONICS CORP 发明人 KURODA HIROSHI
分类号 H01L23/12;H01L21/52;H01L25/04;H01L25/18 主分类号 H01L23/12
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