发明名称 INSPECTION APPARATUS FOR PLATE-LIKE OBJECT TO BE INSPECTED
摘要 <P>PROBLEM TO BE SOLVED: To correctly inspect an object to be inspected without exchanging a panel holder and regardless of whether the object to be inspected includes a polarizer. <P>SOLUTION: An inspection apparatus for a plate-like object to be inspected includes: a first base having a first opening; four second bases cooperatively forming a second opening opposite to the first opening; and at least one elevation device for elevating at least one second base that corresponds to the elevation device. The elevation device is disposed between the first base having the first opening vertically penetrated and the four long second bases disposed above the first base in a frame shape so as to cooperatively form the second opening opposite to the first opening and supports the corresponding second base vertically movably on the first base. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2012047459(A) 申请公布日期 2012.03.08
申请号 JP20100186871 申请日期 2010.08.24
申请人 MICRONICS JAPAN CO LTD 发明人 FUJIWARA SHINJI;IWAO KOICHI
分类号 G01R31/00;G02F1/13;G09F9/00 主分类号 G01R31/00
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