发明名称 OPTICAL MEASURING SYSTEM WITH MATCHED COLLECTION LENS AND DETECTOR LIGHT GUIDE
摘要 An optical surface inspection system provides dark-field detection avoiding ghost images and without capturing, stray, reflected or re-scattered light. The system includes an illumination system that generates an illumination spot on a surface under inspection collecting lens that collects substantially all light scattered from the surface under inspection from the illumination spot. The system also includes a light guide with a first end having a numerical aperture matched to an exit aperture of the collecting lens and a field of view matched to the illumination spot, and a second end coupled to a detector.
申请公布号 US2012057154(A1) 申请公布日期 2012.03.08
申请号 US20100877480 申请日期 2010.09.08
申请人 BRUNFELD ANDREI;CLARK BRYAN;TOKER GREGORY;ROSCROW MOREY T. 发明人 BRUNFELD ANDREI;CLARK BRYAN;TOKER GREGORY;ROSCROW MOREY T.
分类号 G01N21/88 主分类号 G01N21/88
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