| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide a workpiece contour detection method and an image processing system at low costs for quickly performing image processing by using an inexpensive monochromatic camera and reducing the image data processing of a picked-up image, and for eliminating the influence of the shadow of a workpiece in the detection of a workpiece contour even when the shadow of the workpiece is generated in picking up images. <P>SOLUTION: A picked-up image obtained in a first step is binarized by using the luminance of the intermediate value of a floor face and a support part as a threshold, and the binarized image data is used as mask data. A workpiece having the same brightness as the brightness of the surface of the support part is imaged as well as a workpiece base by a monochromatic camera in a state that the camera is supported by the support part so that a picked-up image of the workpiece can be obtained. Image areas 52 and 54 relating to the support part in the mask data are erased from the picked-up image of the workpiece so that a support-part erased image can be obtained. A workpiece outline 57 including the support-part erased portion is extracted from the support-part erased image, and interpolation processing of the support-part erased portion is performed so that a workpiece outline 58 can be obtained. <P>COPYRIGHT: (C)2012,JPO&INPIT |
