| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide a fine particle measurement instrument which is capable of performing measurement in high accuracy by automatically correcting deviation of an optical axis. <P>SOLUTION: A fine particle measurement instrument includes: light collecting means which collects irradiated light radiated to a sample flow where fine particles pass, and traveling straight without being scattered by fine particles and scattered light scattered by fine particles, on a light receiving element divided into a plurality of areas; position control means which adjusts relative positions of members constituting an optical path; and control means which detects collection spot positions of the irradiated light and the scattered light on the basis of signal intensities in respective areas of the light receiving element and controls the position control means so that the collection spot positions of the irradiated light and the scattered light coincide with each other. <P>COPYRIGHT: (C)2012,JPO&INPIT |
