发明名称 LASER MICROSCOPE
摘要 <P>PROBLEM TO BE SOLVED: To provide a laser microscope capable of improving resolution in the XY plane of a specimen. <P>SOLUTION: The laser microscope comprises: a microscope body; a light source part for emitting laser illumination light to a specimen provided in the microscope body; a illumination part for illuminating the illumination light on the specimen; a detection optical system in a conjugate position with the specimen and disposed on the return path of light emitted from the specimen illuminated at the illumination part; and a polarization control element disposed at a position without overlapping with the return path on the forward path where the illumination light emitted from the light source part goes to the specimen, and for controlling polarization distribution into predetermined distribution in a plane perpendicular to the optical axis of the illumination light emitted from the light source part. The polarization control element is disposed at the light source part side rather than at the illumination part side on the optical path of the illumination light. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2012047836(A) 申请公布日期 2012.03.08
申请号 JP20100187704 申请日期 2010.08.24
申请人 NIKON CORP 发明人 MATSUTAME KUMIKO
分类号 G02B21/06;G02B26/10;G02F1/13;G02F1/1335;G02F1/1337 主分类号 G02B21/06
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