发明名称 Non-volatile re-programmable memory device
摘要 A memory device including a non-volatile re-programmable memory cell is provided. In connection with various example embodiments, the memory cell is a single resistor located between a first and second node. The resistor stores different resistance states corresponding to different resistance values set by SiCr-facilitated migration. The SiCr-facilitated migration occurs in response to energy presented between the first and second nodes. The application of a signal to a first node of the memory cell resistor forces the migration of elements along the memory cell resistor to set the resistance value of the memory cell resistor. The application of a second signal of approximately equal strength to the second node reverses the change and resistance and returns the memory cell to the previous resistance level. In some implementations the resistor is made of SiCr.
申请公布号 EP2407976(A3) 申请公布日期 2012.03.07
申请号 EP20110173262 申请日期 2011.07.08
申请人 NXP SEMICONDUCTORS B.V. 发明人 LI, YUAN;GUOQIAO, TAO
分类号 G11C13/00;G11C7/04;G11C7/24;G11C16/22 主分类号 G11C13/00
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