发明名称 METHOD FOR DIAGNOSING LIFETIME OF POWER SWITCHING DEVICE, AND DIAGNOSIS SYSTEM AND DIAGNOSIS PROGRAM THEREFOR
摘要 <P>PROBLEM TO BE SOLVED: To provide a method for diagnosing a lifetime of a power switching device in consideration of characteristics peculiar to the device. <P>SOLUTION: The method for diagnosing a lifetime of a power switching device determines a frequency of minute slides generated at a contact part of the power switching device on the basis of device-unique data 41 and operational environment data 42, determines the amount of decomposition products mixed into the contact part on the basis of the device-unique data 41 and interruption information data 43, calculates an abrasion loss due to the minute slides at the contact part on the basis of the frequency of minute slides and the amount of mixed decomposition products, and diagnoses the lifetime of the power switching device on the basis of the abrasion loss. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2012043708(A) 申请公布日期 2012.03.01
申请号 JP20100185474 申请日期 2010.08.20
申请人 TOKYO ELECTRIC POWER CO INC:THE;TOSHIBA CORP 发明人 TANIGUCHI YOSHINOBU;KANAZAWA YUKIO;MINEYAMA TAKAYA;KOBAYASHI TAKAYUKI;TSUKAO SHIGEYUKI;SENDA HIDEAKI;IKEDA JIRO;ONO YOSHITAKA
分类号 H01H33/00;H01H9/54;H02B13/065 主分类号 H01H33/00
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