发明名称 |
High Frequency Deflection Measurement of IR Absorption |
摘要 |
An AFM based technique has been demonstrated for performing highly localized IR spectroscopy on a sample surface. Such a technique implemented in a commercially viable analytical instrument would be extremely useful. Various aspects of the experimental set-up have to be changed to create a commercial version. The invention addresses many of these issues thereby producing a version of the analytical technique that cab be made generally available to the scientific community.
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申请公布号 |
US2012050718(A1) |
申请公布日期 |
2012.03.01 |
申请号 |
US201113289640 |
申请日期 |
2011.11.04 |
申请人 |
DAZZI A. DAZZI;VODOPYANOV KONSTANTIN;POLICAR CLOTILDE;READING M.;KJOLLER KEVIN;PRATER CRAIG |
发明人 |
DAZZI A. DAZZI;VODOPYANOV KONSTANTIN;POLICAR CLOTILDE;READING M.;KJOLLER KEVIN;PRATER CRAIG |
分类号 |
G01J3/00;G01Q60/24 |
主分类号 |
G01J3/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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