发明名称 WAFER PROCESSING METHOD
摘要 <P>PROBLEM TO BE SOLVED: To provide a wafer processing method capable of reducing wafer damages when grinding a wafer extremely thinly. <P>SOLUTION: A processing method of a wafer 2 where a film layer 5 is formed on a surface and a chamfer part 8 is formed on a peripheral side surface comprises: a cutting step of circularly cutting and removing the film layer 5 at least on the chamfer part 8 by rotating the wafer 2 while cutting a cutting blade 18 into an outer peripheral edge from a surface 2a of the wafer 2; a protective tape sticking step of sticking the protective tape to the surface 2a of the wafer 2 after performing the cutting step; and a grinding step of grinding the reverse side of the wafer 2 on which the protective tape has been stuck to the surface 2a. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2012043825(A) 申请公布日期 2012.03.01
申请号 JP20100180829 申请日期 2010.08.12
申请人 DISCO ABRASIVE SYST LTD 发明人 SEKIYA KAZUMA
分类号 H01L21/304;B24B9/00 主分类号 H01L21/304
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