发明名称 TEMPERATURE MEASUREMENT PROBE
摘要 <P>PROBLEM TO BE SOLVED: To provide a temperature measurement probe which is valid for a long life by suppressing the crack of a silicon nitride protective tube. <P>SOLUTION: The probe is configured to measure a temperature measurement object W whose melting point is higher than that of aluminum alloy molten metal. The probe includes: a silicon nitride protective tube 1; a bottomed protective tube 2 formed of protective materials whose durability to a thermal shock is higher than that of the silicon nitride protective tube 1 for coating the silicon nitride protective tube 1; and a thermocouple element 4 with a temperature measurement contact 44 inserted into the silicon nitride protective tube 1. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2012042323(A) 申请公布日期 2012.03.01
申请号 JP20100183561 申请日期 2010.08.19
申请人 TOKYO YOGYO CO LTD 发明人 FURUKAWA KATSUKIYO
分类号 G01K1/08 主分类号 G01K1/08
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