发明名称 WAVELENGTH-TUNABLE INTERFERENCE FILTER, OPTICAL MODULE, AND OPTICAL ANALYSIS APPARATUS
摘要 A wavelength-tunable interference filter comprising a first substrate, a second substrate facing the first substrate, a first reflective film provided on the first substrate, a second reflective film provided on the second substrate, the second reflective film facing the first reflective film, a first electrode provided on the first substrate, and a second electrode provided on the second substrate, the second electrode facing the first electrode, wherein the first electrode includes a first electrode layer and a second electrode layer, the first electrode layer has a first in-plane internal stress which is compressive, and the second electrode layer has a second in-plane internal stress which is tensile.
申请公布号 US2012050742(A1) 申请公布日期 2012.03.01
申请号 US201113216509 申请日期 2011.08.24
申请人 SANO AKIRA;SEIKO EPSON CORPORATION 发明人 SANO AKIRA
分类号 G01N21/25;G02B5/28;G02B26/00 主分类号 G01N21/25
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