发明名称 |
Dram memory controller with built-in self test and methods for use therewith |
摘要 |
<p>An integrated circuit is interfaced with at least one dynamic random access memory (DRAM) via a memory interface. A plurality of user test options are received. The testing of the memory interface is controlled in accordance with the plurality of user test options. Test data, generated as a result of the testing of the memory interface, is stored.</p> |
申请公布号 |
EP2423922(A1) |
申请公布日期 |
2012.02.29 |
申请号 |
EP20110177820 |
申请日期 |
2011.08.17 |
申请人 |
VIXS SYSTEMS INC. |
发明人 |
GUPTA, RAJAT;YEH, CHUN-CHIN |
分类号 |
G11C29/02;G11C29/16 |
主分类号 |
G11C29/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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