发明名称 MAGNETORESISTANCE ELEMENT AND SEMICONDUCTOR STORAGE DEVICE
摘要 <p>A magnetoresistance element comprises: a first magnetoresistance element portion having a structure in which a first tunnel insulating layer is sandwiched between a first free magnetic layer and a first pinned magnetic layer, wherein the magnetization direction of the first free magnetic layer is changed by an electric current passed in the thickness direction thereof, and the resistance changes between a low-resistance state and a high-resistance state according to the magnetization direction of the first free magnetic layer; and a second magnetoresistance element portion having a structure in which a second tunnel insulating layer is sandwiched between a second free magnetic layer and a second pinned magnetic layer, wherein the magnetization direction of the second free magnetic layer is changed by an electric current passed in the thickness direction thereof, and the resistance changes between the low-resistance state and the high-resistance state according to the magnetization direction of the second free magnetic layer, and has a structure in which the lamination sequence of the free magnetic layer, the tunnel insulating layer, and the pinned magnetic layer is vertically reversed between the first magnetoresistance element portion and the second magnetoresistance element portion, and the first magnetoresistance element portion and the second magnetoresistance element portion overlap each other.</p>
申请公布号 WO2012023157(A1) 申请公布日期 2012.02.23
申请号 WO2010JP05085 申请日期 2010.08.17
申请人 FUJITSU LIMITED;NOSHIRO, HIDEYUKI 发明人 NOSHIRO, HIDEYUKI
分类号 H01L21/8246;G11C11/15;H01L27/105;H01L43/08 主分类号 H01L21/8246
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