| 发明名称 |
Process and apparatus for the measurement of thermal radiation using regular glass optics and short-wave infrared detectors |
| 摘要 |
An infrared measurement apparatus and method to detect and view ambient-temperature objects using short-wave infrared (“SWIR”) detectors which operate in a wavelength region from 2.0 μm to 2.5 μm. |
| 申请公布号 |
US8119987(B2) |
申请公布日期 |
2012.02.21 |
| 申请号 |
US20090472632 |
申请日期 |
2009.05.27 |
| 申请人 |
YOON HOWARD W.;EPPELDAUER GEORGE P. |
发明人 |
YOON HOWARD W.;EPPELDAUER GEORGE P. |
| 分类号 |
G01J5/02 |
主分类号 |
G01J5/02 |
| 代理机构 |
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代理人 |
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