发明名称 SEMICONDUCTOR INTEGRATED CIRCUIT WITH MULTI TEST
摘要 A semiconductor integrated circuit includes a multi-mode control signal generating unit configured to control an activation of a up/down mat I/O switch control signal, which controls I/O switches in a up/down mat, according to a multi-test mode signal and a read/write discriminating signal, a multi-mode decoder configured to output multi-mat select signals to simultaneously activate a plurality of mats according to a multi-test mode active write signal, and a mat controller configured to enable word lines and the I/O switches according to the up/down mat I/O switch control signal and the multi-mat select signals.
申请公布号 US2012039137(A1) 申请公布日期 2012.02.16
申请号 US201113280199 申请日期 2011.10.24
申请人 CHU SHIN HO;LEE JONG WON;HYNIX SEMICONDUCTOR INC. 发明人 CHU SHIN HO;LEE JONG WON
分类号 G11C7/00 主分类号 G11C7/00
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