| 摘要 |
An apparatus for inspecting micro defects on strip samples is provided to move a magnifying glass and an illumination lamp to inspect when grinding a steel surface with a grinder. An apparatus for inspecting micro defects on strip samples by grinding a surface with a grinder to detect the micro defects on the strip samples includes an inspection table(10) disposed at a predetermined height and having an planar upper surface, a pad(20) attached to the upper surface of the inspection table to load the strip sample(Sa) thereon and to prevent light from an illumination lamp from being irregularly defected, an inspection device(30) placed on the inspection table and integrally formed with a magnifying glass and the illumination lamp to move on the strip sample. The pad is a green artificial lawn made of synthetic plastic fiber. The inspection device includes a housing having a power supply and a power cable, an elevator installed in the upper side of the housing, and an inspection window disposed in the upper side of the elevator and having the magnifying glass and the illumination lamp.
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