发明名称 |
Lens for an electron microscope system and electron microscope system |
摘要 |
<p>The lens has a coil body arranged in a chamber between inner and outer pole pieces (111, 112), and a pole piece gap (119) formed between the inner and outer pole pieces. The outer pole piece is outwardly limited by a conical surface at a conical angle (alpha) along a Z-direction. A terminal electrode (114) is outwardly limited by the conical surface at another conical angle along the Z-direction. The terminal electrode is spatial-free magnetically coupled to the outer pole piece for reducing a magnetic field in an object plane. An independent claim is also included for an examining system for monitoring and manipulating an object to be examined, comprising an object holder.</p> |
申请公布号 |
EP2418673(A2) |
申请公布日期 |
2012.02.15 |
申请号 |
EP20110008617 |
申请日期 |
2003.07.17 |
申请人 |
CARL ZEISS NTS GMBH |
发明人 |
PREIKSZAS, DIRK;STEIGERWALD, MICHAEL;HOFFROGGE, PETER;GNAUCK, PETER |
分类号 |
H01J37/145;H01J37/141;H01J37/28;H01J37/30;H01J37/317 |
主分类号 |
H01J37/145 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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