发明名称 MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a method for preventing the collector resistance of a vertical NPN transistor from increasing, with respect to the manufacturing method of a semiconductor device that is equipped with a vertical PNP transistor and a vertical NPN transistor. SOLUTION: In the manufacturing method of the semiconductor device equipped with a vertical PNP transistor and a vertical NPN transistor, an insulating film 55, containing first n-type impurities and second n-type impurities with a larger diffusing constant than that of the first n-type impurities, is formed on a semiconductor substrate 11 of a portion, corresponding to the formation position of an n-type embedding diffusion layer 41, and the n-type embedding diffusion layer 41 is formed, by heating the semiconductor substrate 11 wherein the insulating film 55 is formed, and then by making the first and second n-type impurities diffuse to the semiconductor substrate 11. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2008028338(A) 申请公布日期 2008.02.07
申请号 JP20060202346 申请日期 2006.07.25
申请人 MITSUMI ELECTRIC CO LTD 发明人 WATANABE SADAHISA;OGAWA TAKASHI
分类号 H01L21/8228;H01L21/331;H01L27/082;H01L29/732 主分类号 H01L21/8228
代理机构 代理人
主权项
地址