发明名称 PROCEDIMENTO ATTO AL RIEMPIMENTO DI CAVITA' IN WAFER, FORO CIECO CORRISPONDENTEMENTE RIEMPITO E WAFER CON SCANALATURE DI ISOLAMENTO CORRISPONDENTEMENTE RIEMPITE
摘要 A method is described for filling cavities in wafers, the cavities being open to a predetermined surface of the wafer, including the following steps: applying a lacquer-like filling material to the predetermined surface of the wafer; heating the wafer at a first temperature; driving out gas bubbles enclosed in the filling material by heating the wafer under vacuum at a second temperature which is equal to or higher than the first temperature; and curing the filling material by heating the wafer at a third temperature which is higher than the second temperature. Furthermore, also described is a blind hole filled using such a method and general 3D cavities as well as a wafer having insulation trenches of a silicon via filled using such a method.
申请公布号 ITMI20111490(A1) 申请公布日期 2012.02.14
申请号 IT2011MI01490 申请日期 2011.08.04
申请人 ROBERT BOSCH GMBH 发明人 FREY JENS;GRAF ECKHARD;SCHLOSSER ROMAN;WEBER HERIBERT
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