发明名称 |
TAPE FOR WAFER PROCESSING |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide a tape for wafer processing capable of improving a parting property of an adhesive film and a wafer by expanding and shrinking flexion by expanding. <P>SOLUTION: The tape 1 for wafer processing has a base film 11 and an adhesive layer 12. The tape is used when a wafer W adhered on the adhesive layer 12 is parted corresponding to respective chips C by expanding, or when the adhesive film 13 adhered on the adhesive layer 12 and/or the wafer W adhered on the adhesive film 13 are parted corresponding to the respective chips C by expanding. The tape 1 for wafer processing is shrunk by heating after expanding. The tape has an elongation percentage of 200% or more, and has an elongation percentage of 120% or less by being heated to 120°C after elongated to the elongation percentage of 200%. <P>COPYRIGHT: (C)2012,JPO&INPIT |
申请公布号 |
JP2012028598(A) |
申请公布日期 |
2012.02.09 |
申请号 |
JP20100166722 |
申请日期 |
2010.07.26 |
申请人 |
FURUKAWA ELECTRIC CO LTD:THE |
发明人 |
NAKAMURA TOSHIMITSU;OGAWARA YOSUKE;MORISHIMA YASUMASA;ISHIWATARI SHINICHI |
分类号 |
H01L21/301;C09J7/02;C09J201/00;H01L21/304 |
主分类号 |
H01L21/301 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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