| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide a technique which is capable of inspecting defects throughout an entire object area with preferably reduced effort for advance preparation. <P>SOLUTION: In the case that a repetitive pattern is added to a signature panel area SP of an inspection object (credit card C), color components of the repetitive pattern are preliminarily extracted and removed from an inspection image of the signature panel area SP (A). Next, the inspection object is imaged in inspection processing, and the color components of the repetitive pattern are removed from the inspection image on the basis of preliminarily extracted color components (B). Defects D1 and D2 are extracted through binarization of a reference image and the inspection image after the pattern matching thereof. <P>COPYRIGHT: (C)2012,JPO&INPIT |
