发明名称 |
DEVICE AND METHOD FOR TESTING SEMICONDUCTOR DEVICE |
摘要 |
A testing method for testing a semiconductor device includes heating the semiconductor device until the temperature of the semiconductor device reaches a predetermined temperature; conducting other functional tests other than testing of the overheat protection function in a second step after the temperature of the semiconductor device has reached the predetermined temperature; allowing the semiconductor device to generate heat by itself such that the overheat protection function of the semiconductor device is activated, detecting a first diode forward voltage of a desired diode contained in the semiconductor device when the overheat protection function of the semiconductor device is activated and computing a first computational temperature of the semiconductor device based on the detected first diode forward voltage of the desired diode contained in the semiconductor device; and determining whether the computed first computational temperature of the semiconductor device resides in the overheat protection function activating temperature range.
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申请公布号 |
US2012032696(A1) |
申请公布日期 |
2012.02.09 |
申请号 |
US201113198879 |
申请日期 |
2011.08.05 |
申请人 |
MORINO KOICHI;IKEDA KOUICHI;RICOH COMPANY, LTD. |
发明人 |
MORINO KOICHI;IKEDA KOUICHI |
分类号 |
G01R31/26 |
主分类号 |
G01R31/26 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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