发明名称 METHOD FOR MEASURING STRUCTURED OPTICAL BASE
摘要 <P>PROBLEM TO BE SOLVED: To provide a method for measuring a structured optical base. <P>SOLUTION: In such a state that a first illuminant 211 which emits light through an opening 292 having shadow formation elements 289, 290 and 291 is operated, and a second illuminant 212 is non-operated, a first illuminant image is fetched, and in such a state that the second illuminant 212 is operated, and the first illuminant 211 is non-operated, a second illuminant image is fetched, and a plurality of first luminance values of pixels in the first illuminant image are determined, and a plurality of second luminance values of pixels in the second illuminant image are determined, and a brightness rate of the plurality of second luminance values to the plurality of first luminance values is determined, and an object distance is determined by using the brightness rate. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2012027017(A) 申请公布日期 2012.02.09
申请号 JP20110154365 申请日期 2011.07.13
申请人 GENERAL ELECTRIC CO <GE> 发明人 KLERK ALEXANDER BENDALL
分类号 G01C3/06 主分类号 G01C3/06
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