发明名称 ELECTRONIC COMPONENT ANALYZING APPARATUS AND METHOD
摘要 PURPOSE: An apparatus for stripping an electronic component and a stripping method thereof are provided to improve analysis precision in a solder joint portion by stripping an electronic component without generating ductile fracture in the solder joint portion. CONSTITUTION: A stripping apparatus(10) stripped an electronic component(12) from a substrate(11). The electronic component is a package in which a plurality of solder bumps(13) is arranged in one side of a resin sealing part(12a) as a solder joint portion. The stripping apparatus includes a fixing part(1), a grip part(2), a conveying part(3), a supporting part(4), and an impact force applying part(5). The fixing unit fixes a substrate for a work table(9). The grip part grips an electronic component on the substrate which is fixed to the fixing part. The conveying part has a lever part(3a) and a pillar part(3b). The grip part is attachably and detachably fixed to/from the lever part. The supporting part supports the pillar part over the work table through a rotary shaft(4a) to be shaken. The impact force applying part applies an external force to the conveying part.
申请公布号 KR20120010572(A) 申请公布日期 2012.02.03
申请号 KR20110072596 申请日期 2011.07.21
申请人 FUJITSU LIMITED 发明人 HIRANO YOSHIKAZU;ABE MITSUNORI;FUKUDA TAKASHI
分类号 H05K3/34;B23K1/00;G01N21/88 主分类号 H05K3/34
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