| 摘要 |
<P>PROBLEM TO BE SOLVED: To make it possible to detect the abnormality of low order bits by arranging gradation patterns of mixed colors. <P>SOLUTION: An image display device 10 has a color TFT liquid crystal display device 11. The image display device 10 displays a test pattern 11a on the display device when the inspection mode is selected. The test pattern 11a has a plurality of gradation patterns 11c, 11 m, 11y. These gradation patterns display respectively different mixed colors. The plurality of the gradation patterns are arranged and displayed to be compared with each other. When data designating the gradation of one of the basic color has abnormality, the gradation patterns of mixed colors including the basic colors change. Meanwhile, the gradation patterns of the mixed colors free from the basic color are displayed. As a result, the abnormal state can be recognizably displayed. <P>COPYRIGHT: (C)2012,JPO&INPIT |
