发明名称 ANALYSIS TOOL AND MICROANALYSIS SYSTEM
摘要 <p>Disclosed is an analysis tool which suppresses background and has improved sample detection sensitivity. In a first plate (11) is formed a first concavity (13) having, in the path of excitation light of a surface opposite to a bonding surface (20), a first bottom surface (13a), a first opening (13b), and a slanted surface (13c) which widens from the outer edge of the first bottom surface (13a) towards the edge of the first opening (13b). In a second plate (12), which has a flow path through which a sample flows formed on the bonding surface (20), is formed a second concavity (14) having, in the path of excitation light of a surface opposite to the bonding surface, a second bottom surface (14a), a second opening (14b), and a slanted surface (14c) which widens from the outer edge of the second bottom surface (14a) towards the edge of the second opening (14b). In the disclosed analysis tool (10), the first plate (11) is bonded to the second plate (12), and the first opening (13b) and the second opening (14b) are covered with a film (21, 22).</p>
申请公布号 WO2012011262(A1) 申请公布日期 2012.01.26
申请号 WO2011JP04054 申请日期 2011.07.15
申请人 ENPLAS CORPORATION;ONO, KOICHI 发明人 ONO, KOICHI
分类号 G01N21/64;G01N21/05;G01N37/00 主分类号 G01N21/64
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