发明名称 ANTI-FUSE MEMORY DEVICE
摘要 A One Time Programmable (OTP) memory cell (10) comprising a first, metallic layer (12) coated with a second, conductive stable transition compound (14) with an insulating layer (16) there-between. The first and second layers (12, 14) are selected according to the difference in Gibbs Free Energy between them, which dictates the chemical energy that will be generated as a result of an exothermic chemical reaction between the two materials. The materials of the first and second layers (12, 14) are highly thermally stable in themselves but, when a voltage is applied to the cell (10), a localized breakdown of the insulative layer (16) results which creates a hotspot (18) that sets off an exothermic chemical reaction between the first and second layers (12, 14). The exothermic reaction generates sufficient heat (20) to create a short circuit across the cell and therefore reduce the resistance thereof.
申请公布号 EP1889262(B1) 申请公布日期 2012.01.25
申请号 EP20060728122 申请日期 2006.05.04
申请人 NXP B.V. 发明人 VAN DER SLUIS, PAUL;MIJIRITSKII, ANDREI;WOERLEE, PIERRE, H.;VAN ACHT, VICTOR, M., G.;LAMBERT, NICOLAAS
分类号 G11C17/16;H01L23/525 主分类号 G11C17/16
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