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发明名称
Method for calibrating a pyrometer, method for determining the temperature of a semiconducting wafer and system for determining the temperature of a semiconducting wafer
摘要
申请公布号
EP2251658(B1)
申请公布日期
2012.01.25
申请号
EP20090170604
申请日期
2009.09.17
申请人
LAYTEC AKTIENGESELLSCHAFT
发明人
ZETTLER, JOERG-THOMAS;UREDAT, STEFFEN;ZILIAN, JENS;SCHENK, TOBIAS;HENNINGER, BERND;BINETTI, MARCELLO;HABERLAND, KOLJA
分类号
G01J5/00;G01J5/08;G01J5/52
主分类号
G01J5/00
代理机构
代理人
主权项
地址
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SANITARY PAD HOLDER
HERMETIC REFRIGERATION COMPRESSOR
GOLF CART
MICROCIRCUIT ART GENERATING MEANS
LUMINAIRE REFLECTOR AND LAMPHOLDER MOUNTING
TENSION MEMBER OVERLOAD RELEASE MECHANISM
CONVERSION SYSTEM FOR USE IN ELECTRONIC CALCULATORS
MOUNTING DEVICE FOR ELECTRICAL SWITCH
PIPE JOINT CONNECTOR
TRACTION DEVICE
APPARATUS FOR COOLING WIRE ROD
APPARATUS FOR FORMING T-WELDS BETWEEN MUTUALLY PERPENDICULAR PLATES
PORTABLE FRICTION WELDING MACHINE
WATER SOFTENER DEFLECTOR-DISTRIBUTOR STRUCTURE
FLUID LEVEL SENSING/CONTROL SYSTEMS