发明名称 METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICES HAVING A METALLISATION LAYER
摘要 A method for manufacturing semiconductor devices is disclosed. In one embodiment a semiconductor substrate having a first surface, a second surface opposite to the first surface and a plurality of semiconductor components is provided. The semiconductor substrate has a device thickness. At least one metallisation layer is formed on the second surface of the semiconductor substrate. The metallisation layer has a thickness which is greater than the device thickness.
申请公布号 US2012013029(A1) 申请公布日期 2012.01.19
申请号 US20100837189 申请日期 2010.07.15
申请人 ZELSACHER RUDOLF;GANITZER PAUL;INFINEON TECHNOLOGIES AUSTRIA AG 发明人 ZELSACHER RUDOLF;GANITZER PAUL
分类号 H01L23/488;H01L21/50;H01L21/78 主分类号 H01L23/488
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