发明名称 COF ALIGNMENT MARK
摘要 <P>PROBLEM TO BE SOLVED: To provide a COF alignment mark which is improved so that positional relations in X and Y directions between a COF and a liquid crystal cell can be freely and easily adjusted by visually controlling shift amounts in X and Y directions of the COF relative to the liquid crystal cell. <P>SOLUTION: A COF alignment mark 1 is formed on a COF 2 and comprises a plurality of left and right vertical strip-like marks 1a parallel with each other and a plurality of front and rear horizontal strip-like marks 1b parallel with each other, which are formed surrounding a square cell mark 6 of the liquid crystal cell, and both of the left and right vertical strip-like marks 1a and both of the front and rear horizontal strip-like marks 1b have a fixed width W and a fixed mutual interval G. Both of the left and right vertical strip-like marks 1a and both of the front and rear horizontal strip-like marks 1b are used as scales for visual measurement of shift amounts in X and Y directions respectively to control the shift amounts, whereby positional relations in X and Y directions between the COF and the liquid crystal cell are freely adjusted. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2012013719(A) 申请公布日期 2012.01.19
申请号 JP20100147003 申请日期 2010.06.29
申请人 FUNAI ELECTRIC CO LTD 发明人 KONDO HIROYA
分类号 G02F1/13 主分类号 G02F1/13
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