发明名称 PIN ELECTRONICS CIRCUIT AND TESTING APPARATUS USING THE SAME
摘要 <P>PROBLEM TO BE SOLVED: To provide a testing apparatus capable of easily extracting a simulation model of a transmission line. <P>SOLUTION: An I/O pin P<SB POS="POST">I/O</SB>is connected to a DUT via a transmission line 20. A driver DR generates a test signal to be supplied to the DUT. A driver-side switch 22 and an output resistance Ro are provided in series between the driver and the I/O pin P<SB POS="POST">I/O</SB>. A comparator CP, whose input terminal is connected to the IO pin P<SB POS="POST">I/O</SB>, determines the level of a signal from the DUT. A short switch 34 is provided between the I/O pin P<SB POS="POST">I/O</SB>and a ground terminal. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2012013446(A) 申请公布日期 2012.01.19
申请号 JP20100147778 申请日期 2010.06.29
申请人 ADVANTEST CORP 发明人 NOJIMA SHUJI
分类号 G01R31/28 主分类号 G01R31/28
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