| 摘要 |
PURPOSE: A semiconductor device and a testing method thereof are provided to selectively enable a user to test various kinds of operation in a semiconductor device through a test command. CONSTITUTION: The operation of a semiconductor device is determined whether being a test operation or general operation(210). The operation of the semiconductor device is the general operation. A program, lead, or removal operation is performed according to a user(220). The operation of the semiconductor device is the test operation. A test mode is selected. The test of the program, lead, or removal operation is determined according to a value which the user inputs(230). The test operation, which is selected according to the selection of a user, is performed. The test mode is completed(270).
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