发明名称 SILICON DEVICE STRUCTURE AND SPUTTERING TARGET MATERIAL USED IN FORMING THE SAME
摘要 PURPOSE: A silicon device structure and a sputtering target material used in forming the same is provided to suppress the diffusion from a Cu-Mn-P alloy to an n·a-Si film by using a Cu-Mn-p alloy. CONSTITUTION: A gate electrode layer(10) is formed on a glass substrates(11). A gate insulating layer(9) is formed on the gate electrode layer. An amorphous silicon(8) is formed on the gate insulating layer. An n·a-Si film(6) is formed on the amorphous silicon. An Si oxide film(5) is formed on the n·a-Si film. A Cu alloy film(4) is formed on the Si oxide film.
申请公布号 KR20120004914(A) 申请公布日期 2012.01.13
申请号 KR20110025754 申请日期 2011.03.23
申请人 HITACHI CABLE, LTD. 发明人 TATSUMI NORIYUKI;TONOGI TATSUYA
分类号 H01L21/28;H01L21/203 主分类号 H01L21/28
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