发明名称 WAFER DICING BLADE AND WAFER DICING APPARATUS COMPRISING THE SAME
摘要 PURPOSE: A wafer dicing blade and a wafer dicing apparatus comprising the same are provided to reduce manufacturing cost by reducing the width of the cutting region and the scribe lane formed in a wafer. CONSTITUTION: A wafer dicing blade(200) comprises a cutting part(100) and a supporting part(110). The cutting part is formed into a ring-shape. The cutting part comprises a protrusion(105) which is protruded from one side of the supporting part. A protrusion(105) comprises a domain(107) having a uniform width(H2). The supporting part surrounds the both sides or internal side of the cutting part The length(H1) of protrusion is from the end of the supporting part to the end of the protrusion.
申请公布号 KR20120004843(A) 申请公布日期 2012.01.13
申请号 KR20100065538 申请日期 2010.07.07
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KIM, YOUNG JA;KO, JUN YOUNG
分类号 H01L21/301;H01L21/78 主分类号 H01L21/301
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