SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE

摘要

PROBLEM TO BE SOLVED: To overcome the problem that in the case in which scanning test is performed for a semiconductor integrated circuit (chip) which is received in a regulator the activation ratio of chip becomes very high, resulting in that correct test results cannot be obtained due to IR drop.

SOLUTION: A scanning chain groups provided in a chip are divided into a plurality of circuit blocks. The circuit blocks are provided with voltage before scanning test. The voltage input into each circuit blocks and the reference voltage predetermined are compared with each other. If there is a circuit block with low voltage input, the supply of the test clock to one of the circuit blocks is shutdown. As a result, the scanning test of the circuit blocks can be performed only in accordance with the power driving force of the regulator.

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