发明名称 MEMORY BLOCK MANAGEMENT
摘要 <p>Various embodiments include one or more memory devices having at least two planes of physical blocks organized into super blocks, with each super block including a physical block from each of the at least two planes. Embodiments include determining defective blocks within the planes. If none of the blocks at a particular block position are determined to be defective, embodiments include assigning the blocks at the particular block position to a super block, and if one or more of the blocks at a particular block position are determined to be defective, embodiments include: assigning the blocks at the particular block position determined to be defective to a super block; and assigning a respective replacement block to the super block for each of the one or more blocks at the particular block position determined to be defective. The respective replacement block is selected from a number of blocks within a respective one of the planes that includes the respective block determined to be defective.</p>
申请公布号 EP2404240(A2) 申请公布日期 2012.01.11
申请号 EP20100749034 申请日期 2010.02.24
申请人 MICRON TECHNOLOGY, INC. 发明人 ASNAASHARI, MEHDI;CHEN, ALAN;NEMAZIE, SIAMACK
分类号 G06F12/02;G06F12/06;G06F12/08;G11C29/00 主分类号 G06F12/02
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