| 摘要 |
<p>The delay circuit (100) has delaying elements (10-1,10-2), which delays an input signal at a delaying value and an initialization circuit (20) measures a delaying value. The initialization circuit has a sliding path, which supplies an output signal of the former delaying element and a measuring circuit (26-1) sets sequential delay setting value. Another measuring circuit (26-2) measures a delaying value in the latter delaying element. A delay value evaluation circuit (28) corrects each of the delaying values measured from the former measuring circuit. Independent claims are also included for the following: (1) a test equipment for testing a device (2) a recording medium (3) a semi conductor chip (4) an initialization method (5) an initialization circuit.</p> |
