发明名称 Method of manufacturing a semiconductor device having raised source and drain of differing heights
摘要 This semiconductor device has an MOS transistor equipped with a gate electrode formed on a semiconductor substrate, a source region next to one side of the gate electrode, and a drain region next to another side of the gate electrode, wherein an upper end of the source region and an upper end of the drain region are at positions which are higher than a top surface of the semiconductor substrate, and the height of the upper end of the drain region differs from the height of the upper end of the source region.
申请公布号 US8093130(B2) 申请公布日期 2012.01.10
申请号 US20080022363 申请日期 2008.01.30
申请人 KAWAKITA KEIZO;ELPIDA MEMORY, INC. 发明人 KAWAKITA KEIZO
分类号 H01L21/336 主分类号 H01L21/336
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