发明名称 |
Fast SERDES I/O characterization |
摘要 |
A system and method to perform automatic testing of a device using Design-for-Test functionality built-in a pair of serializer/deserializer (SERDES) of the device to perform I/O characterization with respect to clock jitter in a self-test mode. Performance of a SERDES operating with jitter injected clock signal is characterized by forming a self-test loop-back configuration with another SERDES operating with a clean clock signal where the clean clock signal and the jitter injected clock signal are supplied by a simplified tester. |
申请公布号 |
US8094705(B2) |
申请公布日期 |
2012.01.10 |
申请号 |
US20090403330 |
申请日期 |
2009.03.12 |
申请人 |
WATKINS DANIEL;ORACLE AMERICA, INC. |
发明人 |
WATKINS DANIEL |
分类号 |
H04B3/46 |
主分类号 |
H04B3/46 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|