| 摘要 |
PURPOSE: A test control circuit of a semiconductor device is provided to test operation properties in an asynchronous semiconductor device which not uses a clock signal. CONSTITUTION: A test control apparatus comprises a pulse signal generator(100) and a control signal generator(200). The pulse signal generator generates a pulse signal in response to an entry signal. The control signal generator is activated according to a control termination signal. The activated control signal generator generates a test starting signal in response to the pulse signal and an address signal. The control signal generator generates a test termination signal which is activated after a predetermined time when the test starting signal is activated. |
