发明名称 ACTINIC RAY-SENSITIVE OR RADIATION-SENSITIVE RESIN COMPOSITION, AND RESIST FILM AND PATTERN FORMING METHOD USING THE COMPOSITION
摘要 <P>PROBLEM TO BE SOLVED: To provide an actinic ray-sensitive or radiation-sensitive resin composition having sufficient resolution to give a perpendicular side wall when a contact hole pattern is formed, capable of maintaining a wide EDW (exposure defocus window), and having improved side lobe durability and a reduced number of blob defects. <P>SOLUTION: An active ray-sensitive or radiation-sensitive resin composition contains (A) a resin whose solubility in an alkali developing solution is increased by an action of an acid, (B) a compound which generates an acid upon irradiation with actinic rays or radiation, and (C) a basic compound expressed by general formula (IV). In the general formula, R<SB POS="POST">21</SB>, R<SB POS="POST">22</SB>, R<SB POS="POST">23</SB>, R<SB POS="POST">24</SB>each independently represent a hydrogen atom, an alkyl group, an alkoxy group or an aralkyl group; X represents a hydrogen atom, an alkyl group or an aryl group; and Z represents a heterocyclic group. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2012003070(A) 申请公布日期 2012.01.05
申请号 JP20100138513 申请日期 2010.06.17
申请人 FUJIFILM CORP 发明人 FUJIMORI TORU;YAMADA MASAMI;TOMIGA TAKAMITSU
分类号 G03F7/004;G03F7/039 主分类号 G03F7/004
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