发明名称 CALIBRATION PATTERN FOR IMAGE APPARATUS
摘要 <P>PROBLEM TO BE SOLVED: To provide a calibration pattern for an image apparatus which is capable of reducing a measuring error regardless of a measurement pattern of an object to be measured. <P>SOLUTION: A calibration pattern 1 comprises a center part 11 having a rectangular bright area positioned in the center of the calibration pattern 1 and frame-shaped patterns 12 positioned surrounding the center part 11. The frame-shaped patterns 12 have a horizontal pattern which extends horizontally toward the both sides from the center part 11 and has bright and dark areas arranged repeatedly not at regular intervals but at predetermined intervals, and a vertical pattern which extends vertically toward the both sides from the center part 11 and has bright and dark areas arranged repeatedly not at regular intervals but at predetermined intervals. Both the horizontal and vertical patterns have edges which are separated from a predetermined position in the center part 11 toward the both sides in the both directions at an equal interval. The change directions of the gradation values at each edge is the same. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2012002664(A) 申请公布日期 2012.01.05
申请号 JP20100137907 申请日期 2010.06.17
申请人 MITSUTOYO CORP 发明人 SHISHIDO YUKO
分类号 G01B11/02 主分类号 G01B11/02
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